The Optical Observation of Wide Bandgap in Thin-Layered MnPS3 and CdPS3

Anna Milatul Ummah^1*, Ching Hwa-Ho¹

¹Graduate Institute of Applied Science and Technology, NTUST, Taipei, Taiwan

* Presenter:Anna Milatul Ummah, email:annamilatul.am@gmail.com

The characterization of MnPS3 and CdPS3 have been worked in this report, including the structural and optical properties. Both materials were grown by CVT method and the monoclinic structure was investigated by XRD spectra and TEM. Band-edge excitons of few-layer MnPS3 and CdPS3 were characterized via micro-thermal-modulated reflectance (μTR) and transmittance measurements from 20 to 300K. As resulted, the ionic bonding of MPX3 family contributes to the large bandgap and high sensitivity behavior, representing the hugely potential application in photodetector, optoelectronics and photo(electro)chemical catalysis.

Keywords: metal phosphorus trichalcogenides, structural characterization, optical characterization, photodetector